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Si4312
Table 5. Si4312 Receiver Characteristics
(T A = 25 °C, V DD = 3.3 V, R s = 50 ? , F RF = 433.92 MHz unless otherwise noted)
10 kbps, 315 MHz
1.0 kbps, 433.92 MHz
Data Rate
Parameter
Sensitivity @ BER = 10 –3 (Note 1)
3
Symbol
Test Condition
(Note2)
1.0 kbps, 315 MHz
(Note2)
(Note2)
10 kbps, 433.92 MHz
NRZ
Min
—
—
—
TBD
—
Typ
–110
–103
–106
–101
—
Max
—
—
—
—
10
Unit
dBm
dBm
dBm
dBm
kbps
Desired signal is 3 dB above sensitivity
Adjacent Channel Rejection
±200 kHz (Note 1)
(BER = 10 –3 ), unmodulated interferer
is at ±200 kHz, rejection measured as
difference between desired signal and
TBD
35
—
dB
interferer level in dB when BER = 10 –3
Desired signal is 3 dB above sensitivity
Alternate Channel Rejection
±400 kHz 1,2
(BER = 10 –3 ), unmodulated interferer
is at ±400 kHz, rejection measured as
difference between desired signal and
—
55
—
dB
interferer level in dB when BER = 10 –3
Image Rejection, IF = 128 kHz 1,2
—
23
—
dB
±2 MHz, 1.0 kbps, desired signal is
3 dB above sensitivity, CW interferer
—
65
—
dB
Blocking 1,2
level is increased until BER = 10 –3
±10 MHz, 1.0 kbps, desired signal is
3 dB above sensitivity, CW interferer
—
70
—
dB
level is increased until BER = 10 –3
Maximum RF Input Power 1,2
—
8
—
dBm
| f 2 – f 1 | = 5 MHz, high gain mode,
Input IP3 3
desired signal is 3 dB above sensitivity,
CW interference levels are increased
—
–10
—
dBm
until BER = 10 –3
LNA Input Capacitance 3
—
7
—
pF
Receiver Channel Bandwidth
RX Boot Time 3
4
From reset
—
—
160
500
—
—
kHz
ms
Notes:
1. 1.0 kbps, Manchester encoded, RATIO = 0, TH[1:0] = 00, xtal = ±20 ppm.
2. Guaranteed by characterization.
3. Guaranteed by design.
4. The frequency scanning (see section “3.6. Frequency Scanning”) extends this to 420 kHz.
Table 6. Crystal Characteristics
(V DD = 3.3 V, T A = 25 °C)
Parameter
Crystal Oscillator Frequency
Crystal ESR
XTL1, XTL2 Input Capacitance
Symbol
Test Condition
Min
—
—
—
Typ
16
—
11
Max
—
100
—
Unit
MHz
?
pF
6
Rev. 0.5
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